Study on the Optical Contamination Effect Model of Non-metallic Materials of Spacecrafts

Abstract

Accurate simulation and calculation of the deposition of outgassing molecule on optical device can shorten the cycle and reduce the cost of tests on satellites. It also provides a reference for contamination protection design by systems engineers. In this study, a multilayer film optical contamination effect model is established on the basis of wave propagation in hierarchical media and dielectric film theory and we have simplified David Pekker’s method for obtaining optical constants, which can apply in calculations of optical constants of both adsorbing film and non-adsorbing film. By using ASTM E 595 standard test method and spectrophotometer, then the experiments are carried out. The results show that the multilayer film optical contamination effect model basically accords with the actual cases.