Detection Of Defective Blister Using LabVIEW

  • Anusha M, Pradeep Gowlapally, Nikhileswar Machani Niharika Indla, Murali Krishna Kotha
Keywords: Pattern Matching,LabVIEW,Microcontroller

Abstract

The packing of products plays a crucial role in the pharmaceutical sector.In order to overcome the costly manufacturer recalls we proposed our system. This paper describes the detection of  defects in the blisters, that were sealed, using LabVIEW in a effortless manner.The proposed system probes the blister by using a camera. LabVIEW is meant for computing the image using IMAQdx Vision Toolkit, for performing operations on image by converting it into a single plane image by means of extraction and followed by Pattern Matching to detect the count of  defective tablets.Further the blister that is identified as the faulty one will be automatically declined by the rejection arm of solenoid valve  based on the input signals from the microcontroller .Other practical applications from other disciplines can be fitted to the processing technique.

Published
2021-06-29
How to Cite
Niharika Indla, Murali Krishna Kotha, A. M. P. G. N. M. (2021). Detection Of Defective Blister Using LabVIEW. Design Engineering, 811-820. Retrieved from http://thedesignengineering.com/index.php/DE/article/view/2337
Section
Articles